AST IR Imaging Microscopes

SETNA is the distributor for Eastern USA of the IR Imaging Microscopes of the AST’s line.

These microscopes are employed for sub-surface observation, imaging, verification, inspection of materials and bond integrity.

Typical applications include:

Metrology:

• Overlay alignment measurement and verification.
• Die alignment measurement and verification, (flip chip/hybridization).
• Sub-surface feature based measurements.
• Aperture measurements.
• Thickness measurements based on focus adjust Z.

Inspection:

• MEMS device inspection.
• 3D Stacking process development and control.
• Incoming wafer inspection.
• Photovoltaic inspection.
• Wafer level CSP’s.

AST offers both table top and automated cassette-to-cassette systems, please call us for further details.