Other Products

SETNA is the distributor for Eastern USA of the IR Imaging Microscopes of the AST’s line.

microscopeThese microscopes are employed for sub-surface observation, imaging, verification, inspection of materials and bond integrity.

Typical applications include:

Metrology:

  • Overlay alignment measurement and verification.
  • Die alignment measurement and verification, (flip chip/hybridization).
  • Sub-surface feature based measurements.
  • Aperture measurements.
  • Thickness measurements based on focus adjust Z.

Inspection:

  • MEMS device inspection.
  • 3D Stacking process development and control.
  • Incoming wafer inspection.
  • Photovoltaic inspection.
  • Wafer level CSP’s.

AST offers both table top and automated cassette-to-cassette systems, please call us for further details.

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